NIRISS Ghosts
Reflection from bright sources in the field of view can cause optical ghosts in NIRISS imaging and WFSS observations.
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See also: NIRISS GR150 Grisms
For the NIRISS imaging and wide field slitless spectroscopy (WFSS) modes, there is a chance that optical ghosts may appear in the field of view (FOV) and significantly affect some sources. These optical ghosts are caused by internal reflections of bright sources between the detector and the filter in the light path.
Ghosts in NIRISS are characterized by extended morphology. The exact shape may vary over the FOV and the optical element (e.g., a filter or grism) in the light path. The integrated intensity of ghosts is proportional to the original source, ranging ~0.1%–4%, also depending on the optical element and the position of the source. The characterization of ghosts originating from extended sources is currently unknown. The intersection of lines between bright sources and ghosts, as shown in Figures 1 and 2, is the ghost axis point (GAP). Knowing the coordinates where these intersections occur can help predict and identify the locations of ghosts.
The current knowledge of GAPs and other features of ghosts has been acquired from ground testing campaigns and on-sky commissioning data. More features will be evaluated using available on-sky data.
Mitigation strategies
The impact of ghosts on observations can be assessed by simulating the observing scene with Mirage. Dithering may help to suppress some ghosts in the final image product from the pipeline IMAGE3 step.
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References
Martel, A. 2019 JWST-STScI-004877
The Ghosts of NIRISS: Imaging